Both WPT and WFT are performed using a wafer handler called a wafer prober. The wafer prober brings an array of microscopic needles or probes called a probe card into electrical contact with the wafer (vacuum-mounted on a wafer chuck).

A wafer prober is a system used for electrical testing of the wafers of individual chips. It carries out the loading and handling process while ensuring precise wafer positioning. A vacuum is applied to the backside of each wafer as it is mounted on a round plate called a wafer chuck.

2023年12月14日 · Wafer probing is a method for developing and producing semiconductors that test each wafer electrically. For this test, an automated probing system was used. This machine holds the wafer on a stable mount and uses tin pins, which are used for accurate point pins.

2024年9月10日 · What Is a Wafer Prober? A wafer prober is a machine used to test semiconductor wafers—thin slices of silicon or other semiconductor materials—during the chip manufacturing process. Wafers consist of many individual chips, also called dies, which are eventually packaged into ICs.

2023年3月27日 · Wafer probing is a process in semiconductor development and manufacturing where each dies on a wafer is electrically tested. This is performed with an automated wafer probing system. The system holds a wafer on a stable mount and places a set of very thin pins on designated probe pads on the die.

mea-surements often require that a probe (Fig. 1) be used to contact the circuit con-ductors on the substrate upon which the circuit is constructed: typically a semiconductor wafer, ceramic substrate or microwave laminate material.

2024年5月15日 · Wafer probing is an electrical testing process conducted on semiconductor wafers after integrated circuits are applied. It helps determine the functionality of wafers and overall production quality. What are the key components of a wafer probe system?

2025年1月13日 · A wafer test probe is a vital tool in semiconductor manufacturing, used to test chips during the production process. These small yet precise probes act as a bridge, connecting the testing equipment to the chips.

Wafer Test (also referred to as Wafer Probe) is a vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD). It involves probing individual semiconductor devices on a wafer to identify defects and confirm functionality before further manufacturing.

PS4L is a family of manual, semiautomatic, fully automatic and specialty probe systems with interchangeable components that allows a customer to start with a system that meets their application and budget and perpetually field upgrade it when their requirements change.