Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea ...

As one of the most popular tools used today to analyze data in the semiconductor manufacturing process, wafer-mapping software is capable of calculating reasons of yield loss, as well as identify the ...

Ink marks were traditionally used, but electronic wafer maps are now being employed. Dopant Level / Resistivity Instruments used to determine the type of semiconductor (n or p) or the level of dopant ...

That’s a bit of a stretch, yet the on-ground reality is the challenge of a wafer-thin resource pool. Something must be done soon, lest India becomes a dot on the global semiconductor map.

The federal government on Tuesday said it has issued millions of dollars in subsidies to a firm to expand silicon wafer ...