Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea ...

As one of the most popular tools used today to analyze data in the semiconductor manufacturing process, wafer-mapping software is capable of calculating reasons of yield loss, as well as identify the ...

That’s a bit of a stretch, yet the on-ground reality is the challenge of a wafer-thin resource pool. Something must be done soon, lest India becomes a dot on the global semiconductor map.