Typically, we see a 4X increase in memory size every 3 years to cater to the needs of new generation devices. Deep submicron devices contain a large number of memories which demands lower area and ...

Japanese semiconductor testing equipment firm Advantest has announced its latest testing solutions for advanced applications ...

Because [Gene] expected one bit to work after it had failed and vice versa, the testing protocol used RAM buffers to compare the last state and new state for each bit tested in the Flash.