“Semi-supervised learning (SSL) models, which leverage both labeled and unlabeled datasets, have been increasingly applied to classify wafer bin map patterns in semiconductor manufacturing. These ...

As one of the most popular tools used today to analyze data in the semiconductor manufacturing process, wafer-mapping software is capable of calculating reasons of yield loss, as well as identify the ...

Combined capacity of the top five companies represented 53% of total global wafer capacity at the end of 2019. In contrast, the top five capacity leaders in 2009 held 36% of worldwide capacity.