This illustration shows the Focused Ion Beam (FIB) milling process, a precise method for shaping materials on a nanoscale. A focused beam of gallium ions (depicted as a blue arrow) sculpts a surface ...

A transmission electron microscope (TEM) records an image of the sample. Ion milling systems are used to prepare polished cross-sectional samples for analysis under a scanning electron microscope (SEM ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...

In-situ / System Mounted Instrument or probe mounted on a process tool for in-situ measurement of wafer temperature), thin film ... Instruments such as wafer probers, imaging stations, ellipsometers, ...

The ATC ORION-IM ion milling systems are versatile tools that ... accommodate samples up to 8” in diameter for a wide range of process applications, from nano pattern delineation to bulk wafer ...