Within a decade, this unconventional microscope has evolved into a multifunctional ... Decreasing the size of cantilevers should improve the force resolution, thereby permitting smaller forces ...
Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...
There is another way to investigate the domain of the very small: an atomic force microscope. Unlike their electron spewing brothers, they don’t require high voltages or hard vacuums.
[Andres] is working with an Atomic Force Microscope, a device that drags a small needle across a surface to produce an image with incredible resolution. The AFM can produce native .STL files ...
Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...
Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
Description: As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless ...