capable of obtaining some of the highest resolution images in AFM (operating conditions permitting, of course). In this mode, the tip is always in contact with the sample—hence the name—but due to ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

The probe intermittently contacts the sample surface, reducing lateral forces and minimizing sample damage. Tapping mode C-AFM is particularly useful for studying soft or delicate samples, such as ...